现场可编程门阵列
CMOS芯片
探测器
噪音(视频)
门阵列
计算机科学
寄主(生物学)
可编程逻辑器件
信噪比(成像)
计算机硬件
嵌入式系统
电子工程
工程类
电气工程
电信
人工智能
生物
生态学
图像(数学)
作者
Guipeng Liu,Yunsheng Qian,Gangcheng Jiao,Hongchang Cheng,Kai Qiao,Yizheng Lang
出处
期刊:Sixth Symposium on Novel Optoelectronic Detection Technology and Applications
日期:2020-04-17
摘要
In the field of low-light night vision, EBCMOS (Electron Bombarded Complementary Metal Oxide Semiconductor) has received much attention due to its high-gain, high-resolution, low-noise, etc. The techniques used to test EBCMOS performance are also in urgent need of development. According to the composition of EBCMOS detectors, based on the existing vacuum device and semiconductor device test methods, the SNR testing method of EBCMOS is proposed and the testing system is designed. The Field Programmable Gate Array(FPGA)-based hardware platform is built in the vacuum environment. The CMOS data is read out by programmable logic design. Finally, the SNR is obtained by the MFC host computer. Experiments show that the system can measure accurate SNR parameters.
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