压电响应力显微镜
铁电性
纳米技术
纳米尺度
材料科学
扫描探针显微镜
机电学
压电
显微镜
力谱学
扫描隧道显微镜
光电子学
原子力显微镜
光学
电气工程
物理
电介质
复合材料
工程类
作者
Sergei V. Kalinin,Brian J. Rodriguez,Stephen Jesse,E. Karapetian,Boris Mirman,Eugene А. Eliseev,Anna N. Morozovska
标识
DOI:10.1146/annurev.matsci.37.052506.084323
摘要
Functionality of biological and inorganic systems ranging from nonvolatile computer memories and microelectromechanical systems to electromotor proteins and cellular membranes is ultimately based on the intricate coupling between electrical and mechanical phenomena. In the past decade, piezoresponse force microscopy (PFM) has been established as a powerful tool for nanoscale imaging, spectroscopy, and manipulation of ferroelectric and piezoelectric materials. Here, we give an overview of the fundamental image formation mechanism in PFM and summarize recent theoretical and technological advances. In particular, we show that the signal formation in PFM is complementary to that in the scanning tunneling microscopy (STM) and atomic force microscopy (AFM) techniques, and we discuss the implications. We also consider the prospect of extending PFM beyond ferroelectric characterization for quantitative probing of electromechanical behavior in molecular and biological systems and high-resolution probing of static and dynamic polarization switching processes in low-dimensional ferroelectric materials and heterostructures.
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