铁电性
物理
成核
领域(数学分析)
纳米技术
领域工程
放松(心理学)
电场
工程物理
计算机科学
光电子学
材料科学
电介质
软件
程序设计语言
基于构件的软件工程
软件系统
数学分析
热力学
社会心理学
量子力学
数学
心理学
作者
Linze Li,Lin Xie,Xiaoqing Pan
标识
DOI:10.1088/1361-6633/ab28de
摘要
Ferroelectric materials have been utilized in a broad range of electronic, optical, and electromechanical applications and hold the promise for the design of future high-density nonvolatile memories and multifunctional nano-devices. The applications of ferroelectric materials stem from the ability to switch polarized domains by applying an electric field, and therefore a fundamental understanding of the switching dynamics is critical for design of practical devices. In this review, we summarize the progress in the study of the microscopic process of ferroelectric domain switching using recently developed in situ transmission electron microscopy (TEM). We first briefly introduce the instrumentation, experimental procedures, imaging mechanisms, and analytical methods of the state-of-the-art in situ TEM techniques. The application of these techniques to studying a wide range of complex switching phenomena, including domain nucleation, domain wall motion, domain relaxation, domain-defect interaction, and the interplay between different types of domains, is demonstrated. The underlying physics of these dynamic processes are discussed.
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