A Study on Nanometer Moiré Method and Phase Shifting with Scanning Tunneling Microscope(STM)

In this paper, a new STM nanomoire method for measuring nanometerdeformation was proposed. In the measurement, the moire pattern is generated by the scanning lines of scanning tunneling microscope and the atomic lattice of substance as a specimen grating. At the same time, Phase shifting was realized in four steps from 0 to 2π by controlling the PZT in the STM system to shift the specimen in the direction perpendicular to the gratings. The principles of forming STM nano moire, experimental techniques and phase shifting were described in detail in this paper. Nanodeformation virtual strain of high orientated pyrolytic graphite(HOPG) was measured by using of this method.