拓扑绝缘体
光电子学
材料科学
宽带
响应度
表面状态
光电探测器
光探测
石墨烯
光电二极管
暗电流
无缝回放
异质结
晶体管
比探测率
红外线的
电子迁移率
热传导
化学气相沉积
单层
半导体
绝缘体(电)
表面电导率
作者
Mianzeng Zhong,Shuo Liu,Yali Yu,J. Wen,Xinyun Zhou,Le Yuan,Kaiyao Xin,Ruiying Ma,Qinglin Xia,Penghong Ci,Ziqi Zhou,Jun He,Zhongming Wei
出处
期刊:ACS Nano
[American Chemical Society]
日期:2026-01-14
标识
DOI:10.1021/acsnano.5c19148
摘要
Topological insulators (TIs), characterized by insulating bulk states and metallic surface states hosting Dirac Fermions, exhibit remarkable nonlinear, optical, and optoelectronic properties. Owing to their narrow bandgaps and gapless surface conduction channels, TI-based phototransistors demonstrate high responsivity, low dark currents, and broadband spectral responses. However, the limited diversity of the reported TI materials has constrained their application in high-performance broadband photodetectors. Here, we report the growth of high-quality two-dimensional layered Bi2Te2Se via chemical vapor transport and systematically investigate its electronic and optoelectronic properties. Field-effect transistors (FETs) based on Bi2Te2Se show an impressive on/off current ratio of ∼103 and a carrier mobility of 20.9 cm2V-1s-1. Notably, the devices exhibit a dual-channel transport mechanism, which relies on the synergy between the topological surface states, providing high-mobility pathways for rapid response (∼1.3 μs), and the thermally activated bulk carriers, which can be effectively depleted by gating to suppress the dark current. Furthermore, Bi2Te2Se phototransistors exhibit broadband photodetection across the visible to infrared range (450-1550 nm), achieving a peak responsivity of 155 A/W and a specific detectivity of 2.1 × 1010 Jones under 700 nm illumination. These results highlight the potential of layered Bi2Te2Se as a promising platform for next-generation broadband and high-speed optoelectronic devices.
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