X-ray induced photoelectron and auger spectra of Cu, CuO, Cu2O, and Cu2S thin films

Improved techniques have been used to prepare thin films of Cu, CuO, Cu2O and Cu2S for x-ray photoelectron spectral analysis. The Cu 2p and Cu LMM Auger spectra have been obtained. Photoelectron and Auger chemical shifts as well as qualitative spectral features are found to be useful diagnostics for valence-state characterization of unknowns.