微晶
衍射
方向(向量空间)
结构精修
结晶学
学位(音乐)
材料科学
数学
各向异性
几何学
物理
化学
光学
声学
标识
DOI:10.1107/s0021889809013727
摘要
An analytic expression has been derived connecting the degree of preferred orientation in a polycrystalline material to the March parameter. The latter defines the spread of angular distribution of crystallite inclinations in the March–Dollase approach [March (1932). Z. Kristallogr. 81 , 285–297; Dollase (1986). J. Appl. Cryst. 19 , 267–272]. In turn, the March parameter can be extracted from experimental data using either the Rietveld refinement of the entire diffraction pattern or the measurement of two diffraction intensities originating in the selected crystallographic planes. Working examples taken with two different types of samples are presented.
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