材料科学
图层(电子)
光电子学
外延
气相
化学气相沉积
沉积(地质)
氢化物
相(物质)
纳米技术
冶金
金属
古生物学
有机化学
化学
物理
热力学
生物
沉积物
作者
Huiqiang Yu,Lin Chen,Rong Zhang,Xiang Qian Xiu,Zi Li Xie,Yu Da Ye,Shu Lin Gu,Bo Shen,Yi Shi,You Dou Zheng
出处
期刊:Materials Science Forum
日期:2005-01-15
卷期号:475-479: 3783-3786
被引量:1
标识
DOI:10.4028/www.scientific.net/msf.475-479.3783
摘要
GaN films are grown on Si(111) with low-temperature GaN (LT-GaN) layers as buffer layers by hydride vapor phase epitaxy (HVPE). The LT-GaN layers are deposited at different temperatures ranging from 400 to 900 °C. The surface property, the structure and optical properties of the GaN films with different LT-GaN layers are studied. When deposition temperature of LT-GaN layer is 600 °C, the GaN film shows the best properties.
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