材料科学
光学
光电子学
铁电性
雪崩光电二极管
光电探测器
紫外线
紫外线辐射
光电二极管
近紫外
量子效率
折射率
反射率
光强度
硅
光散射
电场
激光束
作者
Guanyu Xu,Feng Xiong,Jin Wang,Ting Zhi,IRINA PARKHOMENKO,F. F. Komarov,D.J. Chen,Xue Junjun
出处
期刊:Optics Letters
[Optica Publishing Group]
日期:2026-03-16
卷期号:51 (7): 1931-1931
摘要
This paper proposes a back-illuminated separated absorption and multiplication (SAM) structure photodiode based on ferroelectric scandium gallium nitride (ScGaN), which improves the problems of low gain and high operating voltage in conventional gallium nitride (GaN)-based ultraviolet avalanche photodiodes (APDs). Upon introducing an n-type ScGaN interlayer into the device, the strong polarization effect contributes to the enhancement of the built-in electric field. In comparison with conventional p-i-n-i-n GaN-based APDs, the designed back-illuminated device shows a 56% enhancement in avalanche gain to 9.2 × 10 4 and a decrease in avalanche breakdown voltage from 72 V to 64 V. According to analysis of the internal electric field and band structure, this paper explains the physical mechanism behind the performance enhancement and further optimizes the thickness and doping concentration parameters of the n-ScGaN interlayer. The proper utilization of results will greatly advance ScGaN’s potential for future applications in optoelectronic devices.
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