原位
图层(电子)
材料科学
拉曼光谱
显微拉曼光谱
光学
化学
复合材料
物理
有机化学
标识
DOI:10.1088/1361-6463/ac07e0
摘要
In situ Raman microscopy has been adapted to study the plasma–water interface by applying a light sheet technique. The Raman modes of the –OO stretch of H2O2, symmetric stretch (v1) of NO3−, and –OH bend of water were measured simultaneously. By modulating the volume of water under detection, both the bulk liquid and interface regions have been probed with micrometer depth resolution. The plasma was a DC glow discharge generated in atmospheric-pressure air with a water cathode. In the bulk liquid, the molar concentration of aqueous NO3− increased at a linear rate of 48 µM min−1, whereas aqueous H2O2 growth stopped at about 5 mM. The concentrations of H2O2 and NO3− both increased when measuring at depths less than about 20 µm from the interface. The depth profile of NO3− concentration was reconstructed, showing that the interfacial layer of NO3− has a depth of 28 µm. The shape of the meniscus may influence the interpretation of this depth. Previous models of plasma-water interfaces have predicted interfacial layers of similar depth for short-lived aqueous species such as OH but not for long-lived species such as NO3−.
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