过电压
电阻器
切换时间
MOSFET
材料科学
电压
极限(数学)
电气工程
快速切换
光电子学
工程类
晶体管
数学
数学分析
作者
P. Mora,Mark‐M. Bakran
标识
DOI:10.23919/epe20ecceeurope43536.2020.9215810
摘要
This paper explores the turn-off switching behavior of a third-generation SiC MOSFET encapsulated in a TO-247-4 package. The work is focused on the selection of the optimal gate resistance to reduce the turn-off switching losses. The selection criteria is based on the limitation of the inductive over-voltage peak (OVPK) for the worst-case scenario i.e. maximum DC-link voltage and switched current. The gate resistance is tuned to induce the allowed OVPK, gradually, with decreasing gate resistance the switching losses would be reduced but the OVPK would increase. Contrary to the expected behavior, it is observed that there exists a threshold value from which, the decrease of the gate resistor reduces the OVPK and, moreover, the turn-off losses do also decrease.
科研通智能强力驱动
Strongly Powered by AbleSci AI