光伏系统
稳健性(进化)
硅
计算机科学
工程物理
光电子学
光伏
材料科学
量子效率
电子工程
环境科学
电气工程
工程类
化学
生物化学
基因
作者
Philippe Voarino,Adem Dahi,Romain Cariou
标识
DOI:10.1109/pvsc48320.2023.10360025
摘要
Assessment of Solar Cells (SC) characteristics under indoor standard conditions has been a challenge since the beginning of the industrialization of photovoltaic technologies in 1954 by Bell. Nowadays, for spatial industry the use of silicon SCs becomes obvious for Low Earth Orbitrary (LEO) missions. Moreover, accurately knowing electrical performances is key to optimize the PhotoVoltaic Assembly (PVA) design (number of SCs and overall dimensions). This paper proposes a method to assess electrical performances under AMO spectrum, using IV measurements carried out under a terrestrial solar simulator (AM1.5G) and the knowledge of External Quantum Efficiency for different technologies of silicon solar cells. This method is extended at SCs which have been irradiated with 1 MeV electrons at differents fluences. The robustness of this method is then evaluated.
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