碳化硅
极性(国际关系)
纤锌矿晶体结构
堆积
材料科学
极地的
硅
纳米技术
光电子学
结晶学
化学物理
化学
复合材料
锌
物理
冶金
天文
细胞
有机化学
生物化学
作者
Yuan Huang,Hongfeng Lin,Xi Zhang,Gang Xiang
标识
DOI:10.1088/1361-6463/adc468
摘要
Abstract Whether in the form of zinc blende, wurtzite, or a composite structure of the two, silicon carbide (SiC) crystals possess a pair of polar crystal faces along the stacking direction of Si-C bilayers, namely the Si-face and the C-face. These two faces have different atomic structures and surface properties, resulting in anisotropic and surface polarity (SP)-dependent effects on growth and mechanical processing of SiC materials and electrical performance of SiC-based devices. Although much effort has been spent on the studies of the SiC polarity and SP-dependent effects, no systematic review of these studies has been reported. Herein, we aim to comprehensively outline the main aspects of the polarity-dependent effects of SiC, starting from the origin of polarity and culminating in a discussion on how SP affects device performance. Along the way, we will cover several methods for identifying SP and SP-dependent effects on crystal growth, mechanical processing and heteroepitaxy. The particular significance of this study lies in providing a clear research framework and overview that serves as a reference for future research and applications.
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