纳米线
蓝宝石
外延
材料科学
纳米结构
氢化物
纳米尺度
光电子学
氮化镓
纳米技术
图层(电子)
光学
金属
激光器
物理
冶金
作者
Elias Semlali,Evelyne Gil,Geoffrey Avit,Yamina André,Arthur Sauvagnat,Jihen Jridi,А. В. Москаленко,Philip A. Shields,N. Rochat,Adeline Grenier,Agnès Trassoudaine
标识
DOI:10.1021/acs.cgd.4c00925
摘要
Selective area growth (SAG) of GaN nanowires was performed on GaN on c-plane sapphire templates masked with SiN using hydride vapor phase epitaxy (HVPE). GaN nanowires exhibited various morphologies, discussed as a function of the pattern design, the partial pressure of the Ga gaseous precursor, the composition of the carrier gas, and the growth temperature. The morphologies are elucidated by involving a comparative study of growth rates of facets relative to each other. CL measurements showed high emission quality for GaN nanowires grown at 930 °C. This work places HVPE as an effective epitaxial technique for growing III–N nanostructure-based devices at a low cost.
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