材料科学
碳化硅
碳纳米管
纳米技术
带隙
半导体
硅
纳米管
光电子学
复合材料
作者
Zongzhen Han,Heng-Jiang Zhu,Yanbo Zou,Junzhe Lu,Feiyu Zhu,Qian Ning
标识
DOI:10.1016/j.rinp.2022.105658
摘要
By using the first-principles density functional method, the electronic properties of single-walled silicon carbide (SiC) nanotubes were systematically studied, especially the band gap turning by the chiral angle and tube diameter. We propose a new strategy for preparing SiC nanotubes, which can be used to prepare single-walled SiC nanotubes with the expected band gap, named “selective shear suture method”. This research provides a new way to synthesize high-quality materials for nano-scale semiconductors, electrical devices and non-silicon-based chips. In particular, the selective defects in the preparation of single-walled nanotubes by electron beam cutting are theoretically solved. This study also provides useful theoretical guidance for the selective preparation of various single-walled nanotubes.
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