Lv11
50 积分 2024-08-29 加入
Reliability challenges in CMOS technology: A manufacturing process perspective
2小时前
待确认
Investigation of Reliability Characteristics in NMOS and PMOS FinFETs
3小时前
求助中
The Impact of Well-Edge Proximity Effect on PMOS Threshold Voltage in Various Submicron CMOS Technologies
1个月前
已完结
Impact of the TiN electrode deposition on the HfO2 band gap for advanced MOSFET gate stacks
6个月前
已完结
Modulation of the effective work function of TiN metal gate for PMOS application
6个月前
已完结
Atomic layer annealing for modulation of the work function of TiN metal gate for n-type MOS devices
6个月前
已完结
From plastic to elastic stress relaxation in highly mismatched SiGe/Si heterostructures
7个月前
已完结
Strain, stress, and mechanical relaxation in fin-patterned Si/SiGe multilayers for sub-7 nm nanosheet gate-all-around device technology
7个月前
已完结
Control of TiN oxidation upon atomic layer deposition of oxides
8个月前
已完结
Investigation of ALD or PVD (Ti-rich vs. N-rich) TiN metal gate thermal stability on HfO2 high-K
8个月前
已完结
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