Lv41
540 积分 2023-03-15 加入
Materials and Device Reliability in SONOS Memories
4小时前
待确认
Theory of MNOS memory transistor
4小时前
待确认
MNOS Nonvolatile Semiconductor Memory Technology: Present and Future
4小时前
求助中
Properties of MNOS structures
4小时前
待确认
Dielectric Breakdown and Current Conduction of Oxide/Nitride/Oxide Multi‐Layer Structures
4小时前
求助中
Trap-assisted charge injection in MNOS structures
4小时前
求助中
Transient conduction in multidielectric silicon–oxide–nitride–oxide semiconductor structures
4小时前
求助中
Improving Gate Reliability of 6-In E-Mode GaN-Based MIS-HEMTs by Employing Mixed Oxygen and Fluorine Plasma Treatment
1个月前
已完结
Role of the GaN-on-Si Epi-Stack on ΔR ON Caused by Back-Gating Stress
1个月前
已完结
Physical Insights Into Electron Trapping Mechanism in the Carbon-Doped GaN Buffer in AlGaN/GaN HEMTs and Its Impact on Dynamic On-Resistance
1个月前
已完结
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