Lv2
140 积分 2022-12-01 加入
Surface and grain boundary energy as the key enabler of ferroelectricity in nanoscale hafnia-zirconia: a comparison of model and experiment
5天前
已完结
On La-doped HZO as a high-k dielectric for DRAM: Low EOT and approaches for its improvement
18天前
已关闭
Effects of ozone oxidation on interfacial and dielectric properties of thin HfO2 films
29天前
已完结
Enhancing ferroelectricity in dopant-free hafnium oxide
29天前
已完结
Charge trapping studies on ultrathin ZrO2 and HfO2 high-k dielectrics grown by room temperature ultraviolet ozone oxidation
29天前
已完结
Origin of traps and charge transport mechanism in hafnia
29天前
已完结
Microscopic mechanism of imprint in hafnium oxide-based ferroelectrics
29天前
已完结
Microscopic mechanism of imprint in hafnium oxide-based ferroelectrics
29天前
已完结
Study of Metal–Dielectric Interface for Improving Electrical Properties and Reliability of DRAM Capacitor
1个月前
已完结
Investigation of electrical properties of HfO2 metal–insulator–metal (MIM) devices
1个月前
已完结
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