| 标题 |
Impact of heavy ion particle strike induced single event transients on conventional and π -Gate AlGaN/GaN HEMTs |
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期刊:Semiconductor Science and Technology 作者:Khushwant Sehra; Vandana Kumari; Mridula Gupta; Meena Mishra; D S Rawal; et al 出版日期:2021-01-15 |
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(2025-6-4)