| 标题 |
Statistical analysis method for accelerated life testing with incomplete data and competing failure modes |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:Guangze Pan; Xiaobing Li; Yaqiu Li; Dan Li; Chunhui Wang 出版日期:2021-11-01 |
| 求助人 | |
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(2025-6-4)