| 标题 |
Comparative Analysis of IGBT Parameters Variation Under Different Accelerated Aging Tests |
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| DOI | |
| 其它 |
期刊:IEEE Transactions on Electron Devices 作者:Mohamed Halick Mohamed Sathik; Prasanth Sundararajan; Firman Sasongko; Josep Pou; Sivakumar Natarajan 出版日期:2020-03-01 |
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(2025-6-4)