| 标题 |
Accurate determination of surface orientation of single-crystal wafers using high-resolution X-ray rocking curve measurements |
| 网址 | |
| DOI |
10.1107/s0021889813020669
doi
|
| 其它 |
期刊:Journal of Applied Crystallography 作者:Chang Soo Kim; Seok Min Bin; Hyeon-Gu Jeon; Byungsung O; Young Dae Choi 出版日期:2013-09-11 |
| 求助人 | |
| 下载 |
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(2025-6-4)