| 标题 |
Inspection of Trapping and Detrapping Dynamics in Fe- and C-doped GaN-based RF HEMTs by Filling Pulse-Dependent DCT Spectroscopy |
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| 其它 |
期刊:2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) 作者:P. Vigneshwara Raja; Vaidehi Vijay Painter; Raphael Sommet; Jean-Christophe Nallatamby 出版日期:2024 |
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(2025-6-4)