| 标题 |
HPM-Induced Damage Mechanisms and Protection Strategies for AlGaN/GaN HEMTs with Graded Al Barriers and Gate-Misaligned Designs |
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| DOI | |
| 其它 |
期刊:Semiconductor Science and Technology 作者:Sheng Gao; Jiancheng Yuan; Liang Jing; Manjing Wang; Qi Wang 出版日期:2026 |
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(2025-6-4)