| 标题 |
Evaluating OPC performance on novel EUV masks: Mo/Si vs Ru/Si multilayer effects on high-NA random logic via designs |
| 网址 | |
| DOI |
10.1117/12.3119883
doi
|
| 其它 |
期刊:Photomask Technology 2026 作者:Ling Ee Tan; Jeroen Van de Kerkhove; Fergo Treska; Christina Baerts; Bhavishya Chowrira; et al 出版日期:2026-10-30 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人或该文件上传人下载。 |
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(2025-6-4)