| 标题 |
Structural and energetic effects of oxygen vacancies at grain boundaries on the electrical properties of HfO2-based resistive random-access memory |
| 网址 | |
| DOI | |
| 其它 |
期刊:Computational Materials Science 作者:Dehao Qu; Junzhe Liu; Peng‐Fei Cui; Junfeng Gao; Dejun Wang 出版日期:2025-06-24 |
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(2025-6-4)