| 标题 |
Investigation of a New Disturb Effect in the Aggressively Scaled Dual-Bit/Cell Split-Gate Floating-Gate Flash Cell |
| 网址 | |
| DOI | |
| 其它 |
期刊:2023 China Semiconductor Technology International Conference (CSTIC) 作者:Yintong Zhang; Zhaozhao Xu; Dylan Zhou; Alan Shen; Fredric Liu; et al 出版日期:2023 |
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(2025-6-4)