| 标题 |
A Probabilistic Approach of Fault Propagation at RTL and its Application to Transient Fault Analysis |
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| DOI | |
| 其它 |
期刊:2025 IEEE International Test Conference (ITC) 作者:Chien-Hsing Liang; Yu-Hong Chao; Jing-Jia Liou; Harry Chen 出版日期:2025-11-04 |
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(2025-6-4)