| 标题 |
Retention Correlated Read Disturb Errors in 3-D Charge Trap NAND Flash Memory: Observations, Analysis, and Solutions |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 作者:Yachen Kong; Meng Zhang; Xuepeng Zhan; Rui Cao; Jiezhi Chen 出版日期:2020-11-01 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)