| 标题 |
An weak surface defect inspection approach using efficient multi-scale attention and space-to-depth convolution network |
| 网址 | |
| DOI | |
| 其它 |
期刊:Measurement 作者:Guizhong Fu; Jiaao Chen; Shikang Qian; Jing Miao; Jinbin Li; et al 出版日期:2025 |
| 求助人 | |
| 下载 |
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(2025-6-4)