| 标题 |
Investigation on the accuracy of the junction temperature determined by the VCE(T) method under different load pulse durations in power cycling test |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:Jie Chen; Erping Deng; Peng Liu; Yongzhang Huang 出版日期:2021-12-01 |
| 求助人 | |
| 下载 | 该求助完结已超 24 小时,文件已从服务器自动删除,无法下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)