| 标题 |
Analyzing and Modeling of the Susceptibility to Temporary Malfunction in Automatic Gain Control Loops |
| 网址 | |
| DOI | |
| 其它 |
期刊:International Workshop on Electromagnetic Compatibility of Integrated Circuits 作者:T. Billaux; J. Raoult; P. Hoffmann 出版日期:2024-10-07 |
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(2025-6-4)