| 标题 |
High speed and high reliability in Ge8Sb92/Ga30Sb70 stacked thin films for phase change memory applications |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Alloys and Compounds 作者:Zifang He; Ruirui Liu; Pengzhi Wu; Jiwei Zhai; Tianshu Lai; et al 出版日期:2015-12-01 |
| 求助人 | |
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(2025-6-4)