| 标题 |
Wavelength-specific reflections: A decade of extreme ultraviolet actinic mask inspection research |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 作者:K. Goldberg; I. Mochi 出版日期:2010-11-18 |
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(2025-6-4)