| 标题 |
Comparative simulation analysis of displacement Talbot lithography and DUV dry projection lithography for high-resolution periodic patterning |
| 网址 | |
| DOI |
10.1117/12.3091965
doi
|
| 其它 |
期刊:Novel Patterning Technologies 2026 作者:Stefan Rietmann; Kelsey Wooley; Zhixin Wang; Harun Solak; Lawrence S. Melvin; et al 出版日期:2026-04-09 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
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(2025-6-4)