| 标题 |
Loading Effect during SiGe/Si Stack Selective Isotropic Etching for Gate-All-Around Transistors |
| 网址 | |
| DOI | |
| 其它 |
期刊:ACS applied electronic materials 作者:Hua Shao; Tobias Reiter; Rui Chen; Junjie Li; Ziyi Hu; et al 出版日期:2024-10-14 |
| 求助人 | |
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(2025-6-4)