| 标题 |
Strain relaxation process and evolution of crystalline morphologies during the growths of SiGe on Si(110) by solid-source molecular beam epitaxy |
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| DOI | |
| 其它 |
期刊:Materials Science in Semiconductor Processing 作者:Shingo Saito; Yuichi Sano; Takane Yamada; Kosuke O. Hara; Junji Yamanaka; et al 出版日期:2020-07-01 |
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(2025-6-4)