| 标题 |
Novel Channel Backside Engineering for Highly Reliable QLC Operation in 3D Flash Memory |
| 网址 | |
| DOI | |
| 其它 |
期刊:2026 IEEE International Memory Workshop (IMW) 作者:Takayuki Gyakushi; Yukihiro Sakotsubo; Hikaru Arakawa; Tadashi Nakamura; Yosuke Mitsuno; et al 出版日期:2026-05-10 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)