| 标题 |
Comparison of Radiation Effects in Custom and Commercially Fabricated Resistive Memory Devices |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Nuclear Science 作者:Joshua S. Holt; Zahiruddin Alamgir; Karsten Beckmann; Nadia Suguitan; Sierra Russell; et al 出版日期:2019-12-01 |
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(2025-6-4)