| 标题 |
Oxide thickness dependence of swift heavy ion-induced surface tracks formation in silicon dioxide on silicon structures at grazing incidence |
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| DOI | |
| 其它 |
期刊:Journal of Applied Physics 作者:A. M. J. F. Carvalho; A. D. Touboul; M. Marinoni; M. Ramonda; C. Guasch; et al 出版日期:2007-12-22 |
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(2025-6-4)