| 标题 |
Enhancing Silicon Nitride Waveguide Performance: Optimization of Sidewall Roughness for Low-Loss Applications through Resist Reflowing via Tree-Based Modeling of relevant Processing Parameters |
| 网址 | |
| DOI |
10.1117/12.3017081
doi
|
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
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(2025-6-4)