| 标题 |
Thin Film Thickness Analysis Using a Deep Learning Algorithm with a Consideration of Reflectance Fluctuation |
| 网址 | |
| DOI |
10.57062/ijpem-st.2024.00164
doi
|
| 其它 |
期刊:International Journal of Precision Engineering and Manufacturing-Smart Technology 作者:Joonyoung Lee; Jonghan Jin 出版日期:2025-01-01 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
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(2025-6-4)