| 标题 |
Single-Event Cluster Multibit Upsets Due to Localized Latch-Up in a 90 nm COTS SRAM Containing SEL Mitigation Design |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Nuclear Science 作者:Luo Yin-Hong; Zhang Feng-Qi; Guo Hong-Xia; Zhou Hui; Zheng Li-Sang; et al 出版日期:2014-08-01 |
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(2025-6-4)