| 标题 |
Suppression of current collapse by hole injection from drain in a normally-off GaN-based hybrid-drain-embedded gate injection transistor |
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| DOI | |
| 其它 |
期刊:Applied Physics Letters 作者:Kenichiro Tanaka; Tatsuo Morita; Hidekazu Umeda; Saichiro Kaneko; Masayuki Kuroda; et al 出版日期:2015-10-19 |
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(2025-6-4)