| 标题 |
Different Power Cycling Test Lifetime Caused by Different bonding wire lengths |
| 网址 | |
| DOI | |
| 其它 |
期刊:2025 IEEE 8th International Electrical and Energy Conference (CIEEC) 作者:Yushan Zhao; Maoyang Pan; Yiming Zhang; Peng Liu; Yongzhang Huang; et al 出版日期:2025-05-16 |
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(2025-6-4)