| 标题 |
Line edge roughness dependence on normalized image log-slope for line/space pattern |
| 网址 | |
| DOI | |
| 其它 |
期刊:Optical and EUV Nanolithography XXXVIII 作者:Ziyu Zhou; Rohit Kothari; Viviana Agudelo; Ranjan Khurana; Martin Burkhardt; Claire van Lare 出版日期:2025 |
| 求助人 | |
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(2025-6-4)