| 标题 |
Comprehensive physics-based breakdown model for reliability assessment of oxides with thickness ranging from 1 nm up to 12 nm |
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| DOI | |
| 其它 |
期刊:2009 IEEE International Reliability Physics Symposium 作者:Ernest Y. Wu; Jordi Sune; Rolf-Peter Vollertsen 出版日期:2009-07-28 |
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