| 标题 |
Complete unambiguous optical characterization of double layers consisting of two strongly absorbing thin films by combined reflection and transmission ellipsometry |
| 网址 | |
| DOI | |
| 其它 |
期刊:Applied Optics 作者:Ivan Ohlidal; Edward Schmidt; Milan Libezny 出版日期:1990-02-01 |
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(2025-6-4)