| 标题 |
Revealing anisotropic lithiation control in silicon nanowires via a novel in situ TEM-based cross-sectional characterization method |
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| DOI | |
| 其它 |
期刊:Nanoscale Horizons 作者:Sijing Chen; Hai Li; Kailin Luo; Qiuyang Tan; Litao Sun; et al 出版日期:2025-11-03 |
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(2025-6-4)