| 标题 |
Investigation of gamma-ray attenuation characterization in high-purity silicon wafers using an MPPC-based detection system and LabVIEW-assisted theoretical modeling |
| 网址 | |
| DOI | |
| 其它 |
期刊:Radiation Physics and Chemistry 作者:Gozde Tektas; Cuneyt Celiktas 出版日期:2026 |
| 求助人 | |
| 下载 |
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(2025-6-4)